Automatic Four-Circle
X-Ray Diffractometer for Single Crystals
( AFC-5R )

Manufactured by Rigaku Corporation

On irradiating a crystal with an X-ray beam, the scattered X-ray whose position and intensity are dependent upon the kind of constituent atoms and the crystal geometry is measured. The diffuse scattering related to the disorder or the fluctuation of the crystal structure is also observed. By analyzing the scattering intensity, we can determine the crystal structure, the disorder of molecular configuration, the structural fluctuation related to the precusor phenomenon of the phase transition and so on.
The AFC-5R consists of a high power X-ray generator, a four-circle diffractometer and the control system, which performs automatically collecting and recording the scattered X-ray intensity. If the heating or the cooling of the sample is required, heated air or cold nitrogen gas flow equipment with the temperature controller is available.
XG generation 12kW, target Mo/Cu, graphite monochrometer, 4-circle cradle, -87°<2q<161°, -46°<w<66°, -172°<c<180°, full angle f, temperature controlled from 100 to 550K.