Electron Probe Micro Analyzer
( EPMA-V6 )Manufactured by Shimadzu Corporation
By measuring secondary electron or X-ray emissions from a sample irradiated with a very narrow electron beam, the following observations or analyses can be made of a microscopic surface area of less than 1μｍ in diameter.
- Visualization of the sample surface (Scanning Electron Microscopy)
- Qualitative and quantitative elemental determination
- Elemental distribution (Line analysis, Mapping)
- Chemical characterization
- Physical characterization
Applications: Mineralogy, Petrology, Economic Geology, Geology, Astrolithology, Space Science, Environmental Science, Medicine, Agricultural Science, Steels, Nonferrous Metals, Cements, Ceramics, Electronics, Chemicals and Coals